AIP Conference Proceedings [AIP INTERNATIONAL CONFERENCE ON ADVANCED PHASE MEASUREMENT METHODS IN OPTICS AND IMAGING - Monte Verita (Ascona) (16–21 May 2010)] - PHASE SENSITIVE X-RAY IMAGING: TOWARDS ITS INTERDISCIPLINARY APPLICATIONS
Kottler, C., Revol, V., Kaufmann, R., Urban, C., Knop, K., Sennhauser, U., Jerjen, I., Lüthi, T., Cardot, F., Niedermann, P., Morel, J.-P., Maake, C., Walt, H., Knop, E., Blanc, N., Rastogi, Pramod KYear:
2010
Language:
english
DOI:
10.1063/1.3426114
File:
PDF, 1.28 MB
english, 2010
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