Post-Manufacture Tuning for Nano-CMOS Yield Recovery Using...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2010 Vol. 18; Iss. 4

Post-Manufacture Tuning for Nano-CMOS Yield Recovery Using Reconfigurable Logic

Ashouei, M., Chatterjee, A., Singh, A.D.
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Volume:
18
Year:
2010
Language:
english
DOI:
10.1109/tvlsi.2009.2014559
File:
PDF, 415 KB
english, 2010
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