Statistical Leakage Estimation Based on Sequential Addition...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2010 Vol. 18; Iss. 4

Statistical Leakage Estimation Based on Sequential Addition of Cell Leakage Currents

Wook Kim, Kyung Tae Do, Young Hwan Kim
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Volume:
18
Year:
2010
Language:
english
DOI:
10.1109/tvlsi.2009.2013956
File:
PDF, 669 KB
english, 2010
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