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[IEEE 2007 IEEE International Symposium on Electromagnetic Compatibility - Honolulu, HI, USA (2007.07.9-2007.07.13)] 2007 IEEE International Symposium on Electromagnetic Compatibility - Validation of Worst-Case and Statistical Models for an Automotive EMC Expert System
Beetner, Daryl, Weng, Haixiao, Wu, Meilin, Hubing, ToddYear:
2007
Language:
english
DOI:
10.1109/isemc.2007.34
File:
PDF, 259 KB
english, 2007