[IEEE 2001 IEEE International Reliability Physics Symposium...

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[IEEE 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual - Orlando, FL, USA (30 April-3 May 2001)] 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) - Design and analysis of new protection structures for smart power technology with controlled trigger and holding voltage

De Heyn, V., Groeseneken, G., Keppens, B., Natarajan, M., Vacaresse, L., Gallopyn, G.
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Year:
2001
Language:
english
DOI:
10.1109/relphy.2001.922910
File:
PDF, 711 KB
english, 2001
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