[IEEE 2007 IEEE International Test Conference - Santa...

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[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - Test yield estimation for analog/RF circuits over multiple correlated measurements

Fang Liu,, Acar, Erkan, Ozev, Sule
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Year:
2007
Language:
english
DOI:
10.1109/test.2007.4437643
File:
PDF, 600 KB
english, 2007
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