Precise characterization of long-distance mismatch of CMOS...

IEEE Transactions on Semiconductor Manufacturing 2001 Vol. 14; Iss. 4

Precise characterization of long-distance mismatch of CMOS devices

Schaper, U., Linnenbank, C.G., Thewes, R.
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Volume:
14
Year:
2001
Language:
english
DOI:
10.1109/66.964318
File:
PDF, 213 KB
english, 2001
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