[IEEE ICMTS 2002. 2002 International Conference on Microelectronic Test Structures - Cork, Ireland (8-11 April 2002)] Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. - A comparison of extraction techniques for threshold voltage mismatch
Croon, J.A., Tuinhout, H.P., Difrenza, R., Knol, J., Moonen, A.J., Decoutere, S., Maes, H.E., Sansen, W.Year:
2002
Language:
english
DOI:
10.1109/icmts.2002.1193202
File:
PDF, 448 KB
english, 2002