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[IEEE ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures - Monterey, CA, USA (13-16 March 2000)] ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) - A novel approach for precise characterization of long distance mismatch of CMOS-devices
Schaper, U., Linnenbank, C., Thewes, R.Year:
2000
Language:
english
DOI:
10.1109/icmts.2000.844422
File:
PDF, 270 KB
english, 2000