SPIE Proceedings [SPIE Lasers and Materials in Industry and Opto-Contact Workshop - Quebec, Canada (Monday 13 July 1998)] Laser Diodes and Applications III - Semiconductor lasers used as the metrology source in Fourier-transform spectrometers: effect of their noise
Turcotte, Caroline S., Tremblay, Pierre, Genest, Jerome E., Galarneau, PierreVolume:
3415
Year:
1998
Language:
english
DOI:
10.1117/12.326627
File:
PDF, 1.65 MB
english, 1998