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[IEEE 2012 13th International Conference on Ultimate Integration on Silicon (ULIS) - Grenoble, France (2012.03.6-2012.03.7)] 2012 13th International Conference on Ultimate Integration on Silicon (ULIS) - Study of interface and oxide defects in high-k/In0.53Ga0.47As n-MOSFETs
Djara, V., Cherkaoui, K., Schmidt, M., Gomeniuk, Y. Y., O'Connor, E., Povey, I. M., O'Connell, D., Monaghan, S., Pemble, M. E., Hurley, P. K.Year:
2012
Language:
english
DOI:
10.1109/ulis.2012.6193349
File:
PDF, 367 KB
english, 2012