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Structural analysis of multilayer graphene via atomic moiré interferometry
Miller, David L., Kubista, Kevin D., Rutter, Gregory M., Ruan, Ming, de Heer, Walt A., First, Phillip N., Stroscio, Joseph A.Volume:
81
Language:
english
Journal:
Physical Review B
DOI:
10.1103/physrevb.81.125427
Date:
March, 2010
File:
PDF, 571 KB
english, 2010