[IEEE 2011 8th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE 2011) - Merida City, Mexico (2011.10.26-2011.10.28)] 2011 8th International Conference on Electrical Engineering, Computing Science and Automatic Control - Study of the properties of n+-type ZnO:Al films obtained from ZnO/Al/ZnO nanometric structure

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