[IEEE 2012 IEEE International Symposium on Circuits and Systems - ISCAS 2012 - Seoul, Korea (South) (2012.05.20-2012.05.23)] 2012 IEEE International Symposium on Circuits and Systems - Characterization of silicon field effect transistor sub-THz detectors for imaging systems
Foldesy, PeterYear:
2012
Language:
english
DOI:
10.1109/iscas.2012.6272198
File:
PDF, 911 KB
english, 2012