[IEEE 2012 IEEE International Symposium on Electromagnetic Compatibility - EMC 2012 - Pittsburgh, PA, USA (2012.08.6-2012.08.10)] 2012 IEEE International Symposium on Electromagnetic Compatibility - Simulation geometry rasterization for applications toward graphene interconnect characterization
Rautio, Brian J., Long, Qi, Agrawal, Amit, El Sabbagh, Mahmoud A.Year:
2012
Language:
english
DOI:
10.1109/isemc.2012.6351813
File:
PDF, 1.31 MB
english, 2012