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[ACM Press the 2005 conference - Shanghai, China (2005.01.18-2005.01.21)] Proceedings of the 2005 conference on Asia South Pacific design automation - ASP-DAC '05 - Towards automatic parameter extraction for surface-potential-based MOSFET models with the genetic algorithm
Murakawa, Masahiro, Miura-Mattausch, Mitiko, Higuchi, TetsuyaYear:
2005
Language:
english
DOI:
10.1145/1120725.1120805
File:
PDF, 204 KB
english, 2005