Operational Amplifier Based Test Structure for Quantifying...

Operational Amplifier Based Test Structure for Quantifying Transistor Threshold Voltage Variation

Ji, B.L., Pearson, D.J., Lauer, I., Stellari, F., Frank, D.J., Chang, L., Ketchen, M.B.

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Volume:

Year:

2009

Language:

english

DOI:

10.1109/tsm.2008.2010729

File:

PDF, 1.74 MB

english, 2009

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