[IEEE ICMTS 1998. International Conference on...

  • Main
  • [IEEE ICMTS 1998. International...

[IEEE ICMTS 1998. International Conference on Microelectronic Test Structures - Kanazawa, Japan (23-26 March 1998)] ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) - A new direct extraction algorithm for intrinsic Gummel-Poon BJT model parameters

Ingvarson, F., Jeppson, K.O.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
1998
Language:
english
DOI:
10.1109/icmts.1998.688061
File:
PDF, 663 KB
english, 1998
Conversion to is in progress
Conversion to is failed