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[IEEE ICMTS 1998. International Conference on Microelectronic Test Structures - Kanazawa, Japan (23-26 March 1998)] ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) - A new direct extraction algorithm for intrinsic Gummel-Poon BJT model parameters
Ingvarson, F., Jeppson, K.O.Year:
1998
Language:
english
DOI:
10.1109/icmts.1998.688061
File:
PDF, 663 KB
english, 1998