Electrostatic simulation using XFEM for conductor and...

International Journal for Numerical Methods in Engineering 2011 Vol. 85; Iss. 10

Electrostatic simulation using XFEM for conductor and dielectric interfaces

Véronique Rochus, Laurent Van Miegroet, Daniel J. Rixen, Pierre Duysinx
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Volume:
85
Year:
2011
Language:
english
Pages:
1
DOI:
10.1002/nme.2998
File:
PDF, 717 KB
english, 2011
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