![](/img/cover-not-exists.png)
Temperature Dependence of Electrical Breakdown Mechanism on the Left of the Paschen Minimum
Sili, E., Cambronne, J.-P, Koliatene, F.Volume:
39
Language:
english
Journal:
IEEE Transactions on Plasma Science
DOI:
10.1109/tps.2011.2165969
Date:
November, 2011
File:
PDF, 925 KB
english, 2011