Subgap Leakage in $\hbox{Nb/Al}$– $\hbox{AlO}_{\rm x}\hbox{/Nb}$ Josephson Junctions and Run-to-Run Reproducibility: Effects of Oxidation Chamber and Film Stress
Tolpygo, S. K., Amparo, D. J. C., Hunt, R. T., Vivalda, J. A., Yohannes, D. T.Volume:
23
Language:
english
Journal:
IEEE Transactions on Applied Superconductivity
DOI:
10.1109/tasc.2012.2227438
Date:
June, 2013
File:
PDF, 485 KB
english, 2013