[IEEE 2009 IEEE International Solid-State Circuits Conference (ISSCC 2009) - San Francisco, CA (2009.02.8-2009.02.12)] 2009 IEEE International Solid-State Circuits Conference - Digest of Technical Papers - A CMOS smart temperature sensor with a batch-calibrated inaccuracy of ±0.25°C (3σ) from −70°C to 130°C

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