Absolute magnetic penetration depth of thin‐film niobium...

Applied Physics Letters 1993 Vol. 62; Iss. 17

Absolute magnetic penetration depth of thin‐film niobium measured by fluxoid quantization

Cunningham, C. E., Park, G. S., Cabrera, B., Huber, M. E.
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Volume:
62
Year:
1993
Language:
english
DOI:
10.1063/1.109446
File:
PDF, 618 KB
english, 1993
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