An instrument for combining x-ray multiple diffraction and x-ray topographic imaging for examining crystal microcrystallography and perfection
Lai, X., Ma, C. Y., Roberts, K. J., Cardoso, L. P., dos Santos, A. O., Bogg, D., Miller, M. C.Volume:
80
Year:
2009
Language:
english
DOI:
10.1063/1.3103571
File:
PDF, 818 KB
english, 2009