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[IEEE 2010 International Symposium on Next-Generation Electronics (ISNE) - Kaohsiung, Taiwan (2010.11.18-2010.11.19)] 2010 International Symposium on Next Generation Electronics - Numerical study of non-classical unipolar CMOS with different embedded oxide and gate length
Sun, Chih-Hung, Lin, Jyi-Tsong, Chen, Hsuan-Hsu, Eng, Yi-Chuen, Kuo, Chih-Hao, Chang, Tze-Feng, Chen, Chun-Yu, Lin, Po-Hsieh, Chiu, Hsien-NanYear:
2010
Language:
english
DOI:
10.1109/isne.2010.5669137
File:
PDF, 2.08 MB
english, 2010