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[IEEE 2012 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2012) - Miami, FL, USA (2012.07.16-2012.07.20)] 2012 IEEE Radiation Effects Data Workshop - Total Dose and Transient Response of SiGe HBTs from a New 4th-Generation, 90 nm SiGe BiCMOS Technology
Lourenco, Nelson E., Schmid, Robert L., Moen, Kurt A., Phillips, Stanley D., England, Troy D., Cressler, John D., Pekarik, John, Adkisson, James, Camillo-Castillo, Renata, Cheng, Peng, Monaghan, JohnYear:
2012
Language:
english
DOI:
10.1109/redw.2012.6353734
File:
PDF, 778 KB
english, 2012