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A comprehensive study of channel hot-carrier degradation in short channel MOSFETs with high-k dielectrics
E. Amat, T. Kauerauf, R. Rodriguez, M. Nafria, X. Aymerich, R. Degraeve, G. GroesenekenVolume:
103
Year:
2013
Language:
english
DOI:
10.1016/j.mee.2012.10.011
File:
PDF, 654 KB
english, 2013