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[IEEE 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Tallinn, Estonia (2012.04.18-2012.04.20)] 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - A new SAT-based ATPG for generating highly compacted test sets
Eggersglu, Stephan, Krenz-Baath, Rene, Glowatz, Andreas, Hapke, Friedrich, Drechsler, RolfYear:
2012
Language:
english
DOI:
10.1109/ddecs.2012.6219063
File:
PDF, 147 KB
english, 2012