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Electrical and optical characterization of Er‐implanted Si: The role of impurities and defects
Priolo, F., Coffa, S., Franzo, G., Spinella, C., Carnera, A., Bellani, V.Volume:
74
Year:
1993
Language:
english
DOI:
10.1063/1.354330
File:
PDF, 1.22 MB
english, 1993