Comparison study on performances and robustness between SiC...

Microelectronics Reliability 2012 Vol. 52; Iss. 9-10

Comparison study on performances and robustness between SiC MOSFET & JFET devices – Abilities for aeronautics application

D. Othman, M. Berkani, S. Lefebvre, A. Ibrahim, Z. Khatir, A. Bouzourene
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
52
Year:
2012
Language:
english
DOI:
10.1016/j.microrel.2012.06.078
File:
PDF, 1.18 MB
english, 2012
Conversion to is in progress
Conversion to is failed