MultiFrequency Trans-Admittance Scanner: Mathematical Framework and Feasibility
Kim, Sungwhan, Lee, Jeehyun, Seo, Jin Keun, Woo, Eung Je, Zribi, HabibVolume:
69
Language:
english
Journal:
SIAM Journal on Applied Mathematics
DOI:
10.1137/070683593
Date:
January, 2008
File:
PDF, 296 KB
english, 2008