Inverse Problems for Metal Oxide Semiconductor Field-Effect...

SIAM Journal on Applied Mathematics 1992 / 06 Vol. 52; Iss. 3

Inverse Problems for Metal Oxide Semiconductor Field-Effect Transistor Contact Resistivity

Fang, Weifu, Cumberbatch, Ellis
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Volume:
52
Language:
english
Journal:
SIAM Journal on Applied Mathematics
DOI:
10.1137/0152039
Date:
June, 1992
File:
PDF, 1.02 MB
english, 1992
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