![](/img/cover-not-exists.png)
[IEEE 2012 IEEE Aerospace Conference - Big Sky, MT (2012.03.3-2012.03.10)] 2012 IEEE Aerospace Conference - Probabilistic design-for-reliability concept and novel approach to qualification testing of aerospace electronic products
Suhir, E., Mahajan, R., Lucero, A. E., Bechou, L.Year:
2012
Language:
english
DOI:
10.1109/aero.2012.6187373
File:
PDF, 1.62 MB
english, 2012