An analytical two dimensional subthreshold behavior model...

An analytical two dimensional subthreshold behavior model to study the nanoscale GCGS DG Si MOSFET including interfacial trap effects

Bentrcia, T., Djeffal, F., Chahdi, M.
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Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2012.12.005
Date:
April, 2013
File:
PDF, 557 KB
english, 2013
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