SPIE Proceedings [SPIE Optical Systems Design - St....

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SPIE Proceedings [SPIE Optical Systems Design - St. Etienne, France (Tuesday 30 September 2003)] Optical Design and Engineering - Imaging lens design using image quality metric

Olives, Jean-Luc, Kolehmainen, Timo T., Aikio, Janne, Kataja, Kari J., Karioja, Pentti, Vuori, Tero, Mustonen, T., Mazuray, Laurent, Rogers, Philip J., Wartmann, Rolf
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Volume:
5249
Year:
2004
Language:
english
DOI:
10.1117/12.512817
File:
PDF, 935 KB
english, 2004
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