Temperature dependence of current density and admittance in metal-insulator-semiconductor junctions with molecular insulator
Fadjie-Djomkam, A. B., Ababou-Girard, S., Hiremath, R., Herrier, C., Fabre, B., Solal, F., Godet, C.Volume:
110
Year:
2011
Language:
english
DOI:
10.1063/1.3651401
File:
PDF, 1.87 MB
english, 2011