Depth Resolution Enhancement Technique for CMOS...

IEEE Sensors Journal 2012 Vol. 12; Iss. 6

Depth Resolution Enhancement Technique for CMOS Time-of-Flight 3-D Image Sensors

Hafiane, M.L., Wagner, W., Dibi, Z., Manck, O.
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Volume:
12
Year:
2012
Language:
english
DOI:
10.1109/jsen.2012.2187350
File:
PDF, 1.22 MB
english, 2012
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