Fast RF-CV Characterization Through High-Speed 1-port S-Parameter Measurements
Herfst, R. W., Steeneken, P. G., Tiggelman, M. P. J., Stulemeijer, J., Schmitz, J.Volume:
25
Year:
2012
Language:
english
DOI:
10.1109/tsm.2012.2202752
File:
PDF, 3.89 MB
english, 2012