Characterizations of polycrystalline silicon nanowire...

Solid-State Electronics 2012 / 11 Vol. 77

Characterizations of polycrystalline silicon nanowire thin-film transistors enhanced by metal-induced lateral crystallization

Su, Chun-Jung, Huang, Yu-Feng, Lin, Horng-Chih, Huang, Tiao-Yuan
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Volume:
77
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2012.05.025
Date:
November, 2012
File:
PDF, 1.03 MB
english, 2012
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