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Approximating Binary Images from Discrete X-Rays
Gritzmann, Peter, de Vries, Sven, Wiegelmann, MarkusVolume:
11
Language:
english
Journal:
SIAM Journal on Optimization
DOI:
10.1137/s105262349935726x
Date:
January, 2000
File:
PDF, 370 KB
english, 2000