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[IEEE 2006 IEEE International Integrated Reliability Workshop Final Report - South Lake Tahoe, CA, USA (2006.10.16-2006.09.19)] 2006 IEEE International Integrated Reliability Workshop Final Report - Leakage current variation with time in Ta2O5 MIM and MIS capacitors

Manceau, J-p., Bruyere, S., Jeannot, S., Sylvestre, A., Gonon, P.
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Year:
2006
Language:
english
DOI:
10.1109/irws.2006.305226
File:
PDF, 5.41 MB
english, 2006
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