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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Zoom Lenses IV - Method of zoom lenses aberrations analysis
Livshits, I., Ezhova, K., Zverev, V., Luen, Nguen Van, Betensky, Ellis I., Yamanashi, TakanoriVolume:
8488
Year:
2012
Language:
english
DOI:
10.1117/12.928169
File:
PDF, 567 KB
english, 2012