Materials and Reliability Handbook for Semiconductor Optical and Electron Devices || Strain Effects in AlGaN/GaN HEMTs
Ueda, Osamu, Pearton, Stephen J.Volume:
10.1007/97
Year:
2013
Language:
english
DOI:
10.1007/978-1-4614-4337-7_12
File:
PDF, 1.78 MB
english, 2013