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[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Layout debugging demonstration by FIB circuit edit
Po Fu Chou,, Chun Ming Tsai,, Yu Hsiang Shu,Year:
2010
Language:
english
DOI:
10.1109/ipfa.2010.5531976
File:
PDF, 1.53 MB
english, 2010