[IEEE 2012 24th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Bruges, Belgium (2012.06.3-2012.06.7)] 2012 24th International Symposium on Power Semiconductor Devices and ICs - Low leakage normally-off tri-gate GaN MISFET
Lu, Bin, Matioli, Elison, Palacios, TomasYear:
2012
Language:
english
DOI:
10.1109/ispsd.2012.6229016
File:
PDF, 1.31 MB
english, 2012