[IEEE 2008 1st IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems (NDCS 2008) - Cambridge, MA (2008.09.29-2008.09.30)] 2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems - New SRAM Cell Design for Low Power and High Reliability Using  32nm Independent Gate FinFET Technology

The file will be sent to your email address. It may take up to 1-5 minutes before you receive it.

The file will be sent to you via the Telegram messenger. It may take up to 1-5 minutes before you receive it.

Note: Make sure you have linked your account to Z-Library Telegram bot.

The file will be sent to your Kindle account. It may take up to 1–5 minutes before you receive it.

Please note: you need to verify every book you want to send to your Kindle. Check your mailbox for the verification email from Amazon Kindle.