[IEEE 2009 IEEE Custom Integrated Circuits Conference (CICC) - San Jose, CA, USA (2009.09.13-2009.09.16)] 2009 IEEE Custom Integrated Circuits Conference - Asymmetric sizing in a 45nm 5T SRAM to improve read stability over 6T
Nalam, Satyanand, Calhoun, Benton H.Year:
2009
Language:
english
DOI:
10.1109/cicc.2009.5280733
File:
PDF, 625 KB
english, 2009