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[IEEE 1994 IEEE 6th International Conference on Indium Phosphide and Related Materials (IPRM) - Santa Barbara, CA, USA (27-31 March 1994)] Proceedings of 1994 IEEE 6th International Conference on Indium Phosphide and Related Materials (IPRM) - Optical constants for ellipsometric thickness determination of strained AlAs and InAs layers on InP
Herzinger, C.M., Snyder, P.G., Celii, F.G., Kao, Y.-C., Johs, B., Woollam, J.A.Year:
1994
Language:
english
DOI:
10.1109/iciprm.1994.328177
File:
PDF, 379 KB
english, 1994