Studies of thin strained InAs, AlAs, and AlSb layers by spectroscopic ellipsometry
Herzinger, C. M., Snyder, P. G., Celii, F. G., Kao, Y.‐C., Chow, D., Johs, B., Woollam, J. A.Volume:
79
Year:
1996
Language:
english
DOI:
10.1063/1.361137
File:
PDF, 452 KB
english, 1996