X-ray determination of the molecular tilt and layer...

X-ray determination of the molecular tilt and layer fluctuation profiles of freely suspended liquid-crystal films

Tweet, Douglas J., Hołyst, Robert, Swanson, Brian D., Stragier, Hans, Sorensen, Larry B.
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Volume:
65
Language:
english
Journal:
Physical Review Letters
DOI:
10.1103/physrevlett.65.2157
Date:
October, 1990
File:
PDF, 178 KB
english, 1990
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